optical deflection

Measurement result is affected by inherent attribution and relative place of polarized light crystal in optical path,which is analyzed in this paper and corresponding methods of adjustment and compensation are discussed.

用锥光全息非接触式测量系统进行距离测量的精度会受到系统自身的原理结构和光学元件布局的影响,重点分析光路中的核心元件偏光晶体等器件自身的固有属性和相对位置对测量结果的影响,并讨论了相应的调整和补偿措施。

As the polarization technology development, the application range of the crystal polarizing device become more and more larger.

随着偏光技术的发展,晶体偏光器件得到了越来越多的应用。